纳米计量实验室-科技论文

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文章

1

Y. Shi, W. Li, S. Gao, et al, Atomic force microscope scanning head with 3-dimensional orthogonal scanning to eliminate the curved coupling, Ultramicroscopy, 190, 77-80, 2018.

2

Huang L, Guo D, Liu X, et al. Effects of nano thickener deposited film on the behaviour of starvation and replenishment of lubricating greases[J]. Friction, 2017, 4(4):1-11.  SCI 收录

3

H. Wang , S. Gao, W. Li, et al. Characterization of Akiyama probe applied to dual-probes atomic force microscope. Proceedings of the SPIE, 2016, 155:101553R.

4

R. Zhang, S. Gao, W. Li, et al, Control and measuring system of a two-dimensional scanning nanopositioning stage based on LabVIEW, Proceedings of SPIE, 2015, 9795: 979514.

5

Qi Li, Sitian Gao, Wei Li, et al. Performance improvement of a large range metrological AFM through parasitic interference feedback artifacts removing by using laser multimode modulation method. Proceedings of SPIE Scanning Microscopies 2013: Advanced Microscopy Technologies for Defense, Homeland Security, Forensic, Life, Environmental, and Industrial Sciences. Index number: 20133316600004.

6

Qi Li, Shi Li, Yushu Shi, Sitian Gao, et al. Nonlinearity analysis in homodyne multi-pass interferometer with Jones matrix and correction with Fourier harmonic components method. SPIE proceeding of AOMATT 2014.

7

X Liu, L Huang, D Guo, et al. Infrared Thermography Investigation of an Evaporating Water/Oil Meniscus in Confined Geometry[J]. Langmuir, 2016, 33(1):197-205. SCI 收录